Join us for an insightful session regarding the future of trustworthiness in the digital realm at Convened Session 4 on 5th June at EuCNC conference. This session, chaired by Patrick Pype and Manuela Neyer, will discuss the critical domains of security, reliability, and beyond.
The session will commence with an overview of the current threat landscape, as outlined in the forthcoming ICS CERT landscape report by Kaspersky. These findings will underscore the urgent need for robust solutions to counter malicious attacks, and ensure the integrity of our digital systems.
A central focus of the session will be the role of trustworthiness throughout the lifecycle of microelectronics. As microelectronics increasingly permeate every aspect of modern life, ensuring their reliability and security will be paramount. From design to manufacturing to operation, each phase must undergo meticulous scrutiny to mitigate risks and threats effectively.
Attendees can anticipate an in-depth presentation of the recently published COREnext White Paper, which offers valuable insights into future strategies for enhancing trustworthiness in microelectronics. Fredrik Tillman from Ericsson and Zulaicha Parastuty from Infineon will provide a preview of the proposed solutions, emphasizing the importance of preventive measures and rigorous verification processes.
The session will culminate in a dynamic panel discussion featuring industry luminaries such as Patrick Pype, Franz Dielacher, Stefan Wunderer, Panagiotis Demestichas, and Mamoun Guenach. Participants will discuss the challenges posed by cybersecurity threats and explore potential solutions to address them. Collaboration and knowledge-sharing among stakeholders will be key themes of the discussion, driving advancements in trustworthiness across industries.